Precision Measurements Using Semiconductor Light Sources: Applications in Polarimetry and Spectroscopy

Abstract

This thesis comprises two parts:Part I describes a method to improve the accuracy with which the polarization state of light can be characterized by the rotating quarter-wave plate technique. Through detailed analysis, verified by experiment, we determine the positions of the optic axes of the retarder and linear polarizer, and the wave plate retardance, to better than 1° for typical signal-to-noise ratios. Accurate determination of the Stokes parameters can be achieved using this technique to determine the precise retardance at each of the wavelengths of interest. In Part II, a theoretical analysis of the Fabry-Perot interferometer and its application to quantitative absorption spectroscopy is presented. Specifically the effects of broadening due to non-monochromatic light sources and examples of non-ideal etalon surfaces on the visibility of absorption features are investigated. The potential of this type of spectrometer for ethanol detection in a portable breath analysis application is discussed.

Author Keywords: ABSORPTION SPECTROSCOPY, CALIBRATION, FABRY-PEROT INTERFEROMETER, OPTICS, POLARIMETRY

    Item Description
    Type
    Contributors
    Creator (cre): Romerein, Matthew J
    Thesis advisor (ths): Shiell, Ralph C
    Degree granting institution (dgg): Trent University
    Date Issued
    2011
    Date (Unspecified)
    2011
    Place Published
    Peterborough, ON
    Language
    Extent
    89 pages
    Rights
    Copyright is held by the author, with all rights reserved, unless otherwise noted.
    Local Identifier
    TC-OPET-11169
    Publisher
    Trent University
    Degree
    Master of Science (M.Sc.): Materials Science